Details

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Our chip test sockets are expertly crafted to provide a reliable and accurate interface between test equipment and semiconductor devices. Designed to support efficient electrical contact during IC and chip-level testing, these sockets are ideal for engineering validation, production testing, and failure analysis. 


Key Features:

• High-frequency and low-contact resistance performance
• Durable construction for repeated test cycles
• Designed for compatibility with automated test equipment (ATE)
• Customizable for unique testing requirements